The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 1999

Filed:

Dec. 11, 1996
Applicant:
Inventors:

Kenneth Lee Perdue, Franklin, IN (US);

Richard B Swager, Plainfield, IN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q / ;
U.S. Cl.
CPC ...
702 28 ; 7329 / ; 73291 ; 340618 ; 340620 ;
Abstract

A method and apparatus for processing a time domain reflectometry (TDR) signal having a plurality of reflection pulses to generate a valid output result corresponding to a process variable in a vessel. The method includes the steps of establishing an initial boundary signal before the process variable is locates in the vessel, storing the initial boundary signal, detecting the TDR signal, and determining a baseline signal by subtracting the initial boundary signal from the TDR signal. The method also includes the steps of establishing a signal pattern having a time range based on the width of reflection pulses in the baseline signal, comparing the baseline signal to the signal pattern until a reflection pulse in the baseline signal matches the signal pattern, determining a maximum value of the reflection pulse that matches the signal pattern, and calculating an output result based on the maximum value.


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