The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1999
Filed:
Apr. 03, 1997
Gianni Matteucci, Houston, TX (US);
Exxon Production Research Company, Houston, TX (US);
Abstract
A method for quantitatively measuring lateral continuity at a specified subsurface location from seismic data. The seismic data trace nearest to the specified location is designated as the reference trace. Next, all data traces falling within a specified distance from the reference trace are extracted from the data, and one or more statistics which measure the similarity between each trace and the reference trace are calculated. Only the portions of the traces falling within the target formation are considered. Preferably, the statistics should permit comparison of both the temporal and atemporal behaviors of the traces. The results are compared to objective significance tests to determine whether each trace is the same as or different from the reference trace.