The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1999
Filed:
Dec. 09, 1996
Gary L Swoboda, Sugarland, TX (US);
Eric J Stotzer, Houston, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method for testing a digital processor 11 in which a test port 1149 is used to transfer trace data from the digital processor to a test host processor 1101 under control of a user definable program which executes in response to predetermined events on the digital processor. Trace data is gathered while an application program loaded in program memory 61 is executed by the digital processor. Trace data is temporarily stored in a trace region 99 of data memory 25 by user definable code which is executed in a background manner by the digital processor in response to trigger events. The trigger events are also enabled by user definable code which enables various portions of analysis hardware 1217. Trace data is transferred from the digital processor to the test host processor through test port 1149 by sending a notification signal to the test host processor by means of message passing register 1216. The digital processor then monitors the message passing register for a handshake signal from the test host processor. When a handshake signal is received, trace data is written into the message passing register by user definable code in a background manner and transferred to the test host processor.