The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 1999

Filed:

Jan. 30, 1997
Applicant:
Inventor:

Adam L Schwartz, Berkeley, CA (US);

Assignee:

LGC Wireless, Berkeley, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L / ;
U.S. Cl.
CPC ...
370243 ; 370279 ; 370281 ; 370293 ;
Abstract

A frequency band, or test band, located between the uplink and downlink frequency bands of a distributed, frequency duplexed network is used in a novel way to isolate block-level faults within the network. A test signal having frequencies within the test signal band is generated and fed into a downlink path of a branch of the communication network. When the test signal encounters a remote station having duplexing means, the test signal leaks through the duplexing means into an uplink path of the remote station. This occurs because the real filters of the duplexing means do not work perfectly, frequencies outside of the uplink and downlink bands, especially those in the test signal band, will leak through its components. The amount of attenuation of the test signal in leaking through the communication station indicates the operability status of the components therein. By monitoring the power level of the test signal in the uplink and downlink paths of the branch, faults can be quickly isolated.


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