The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1999
Filed:
Sep. 16, 1997
John E Davis, Claremont, CA (US);
Marion Todd, Redondo Beach, CA (US);
Boeing North American, Inc., Seal Beach, CA (US);
Abstract
A Fourier transform interferometer for rapid scanning of scenes such as explosions wherein an incoming beam of light to be analyzed is split by a beam splitter into a first portion and a second portion. The first portion of the incoming light is sent down one arm of the interferometer where it passes through a rotating scanning cube for changing the path length in that arm of the interferometer. The light is then reflected by a retro mirror and sent back through the scanning cube to the beam splitter for sending a portion of the returning beam to a detector. The second portion of the incoming light is sent down a second arm of the interferometer where it passes through a compensator. The light is then reflected by a retro mirror and sent back through the compensator to the beam splitter for sending a portion of the returning beam to a detector. The first and second portions of the incoming light having differing path lengths interfere and the detector measures the fringes created.