The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 1999

Filed:

Aug. 21, 1997
Applicant:
Inventors:

Isao Okuda, Tokyo, JP;

Toshiyuki Kase, Kanagawa-ken, JP;

Hiroshi Nishikawa, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01C / ;
U.S. Cl.
CPC ...
356138 ; 356375 ; 359811 ; 2502014 ;
Abstract

An inclination monitoring system for monitoring an inclination of a lens having a lens portion and a flange portion surrounding the lens portion with respect to a reference plane. The inclination monitoring system includes a light emitting system which emits a collimated light beam towards the lens. The light emitting system and the lens are arranged such that optical axes of the light emitting system and the lens form a first predetermined angle. The monitoring system is further provided with a light receiving system which receives light reflected by the lens. The light receiving system is arranged in a predetermined positional relationship with respect to the light emitting system and the lens. In particular, the collimated light beam illuminates an entire area of the flange portion.


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