The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1999
Filed:
Dec. 14, 1995
Tsutomu Saito, Shizuoka-ken, JP;
Kabushiki Kaisha Kawai Gakki Seisakusho, Hamamatsu, JP;
Abstract
A signal generating apparatus and a signal generating method, for storing specific sampling data D.sub.M, wherein 0<M<N-1, selected among sampling data D.sub.i obtained by sampling a wave in sampling points P.sub.i, wherein i=0, 1, 2, . . . N-1, and differential wave data .DELTA.WD.sub.n, wherein n=1, 2, 3, . . . , M-1, M+1, . . . N-2, N-1, obtained by '.DELTA.WD.sub.n =D.sub.n -D.sub.n-1 ', consecutively generating wave readout address A.sub.M for designating the specific sampling data D.sub.M and wave readout address A.sub.n for designating the differential wave data .DELTA.WD.sub.n, storing the specific sampling data D.sub.M designated by the wave readout address A.sub.M in temporary storage, when the generated wave readout address is A.sub.M, or accumulating the differential wave data .DELTA.WD.sub.n designated by the wave readout address A.sub.n in the temporary storage, thereby to generate sampling data YD.sub.n, when the generated wave readout address is A.sub.n, and generating a signal on the basis of the obtained specific sampling data D.sub.M or sampling data YD.sub.n.