The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 1999

Filed:

Nov. 01, 1996
Applicant:
Inventors:

Zygmunt M Andrevski, Princeton, NJ (US);

William Ronald Roach, Rocky Hill, NJ (US);

Peter David Southgate, Monmouth Junction, NJ (US);

Peter John Zanzucchi, Lawrenceville, NJ (US);

Assignee:

Sarnoff Corporation, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12P / ; C12M / ; G01N / ;
U.S. Cl.
CPC ...
435 912 ; 435 911 ; 4352872 ; 4352873 ; 422 50 ; 422 55 ; 422 63 ; 422 64 ; 422 681 ; 422 8205 ; 422 8217 ; 422 99 ;
Abstract

The invention relates to an assay system for conducting elevated temperature reactions in a fluid-tight manner within a reaction chamber, the assay system comprising: (a) a first assembly comprising the reaction chamber, and (b) a second assembly for temperature control, wherein the second assembly can be positioned adjacent to the reaction chamber. More particularly, the invention relates to an assay system comprising (a) a reaction chamber having a cover formed of a deformable material and (b) a mechanism for rapidly adjusting the temperature of the reaction chamber.


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