The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 1999

Filed:

Apr. 14, 1997
Applicant:
Inventors:

Vicky Linn Funanage, Wilmington, DE (US);

Mena Scavina, Philadelphia, PA (US);

Assignee:

The Nemours Foundation, Jacksonville, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q / ; C07H / ; C12P / ;
U.S. Cl.
CPC ...
435-6 ; 435 912 ; 536 2431 ; 536 2433 ;
Abstract

A diagnostic method for determining whether an individual is affected with spinal muscular atrophy involves evaluating the relative amounts of exon 5 of Neuronal Apoptosis Inhibitory Protein (NAIP) and exon 7 of centromeric and telomeric Survival Motor Neuron (SMN) genes in a genomic sample from the subject. A PCR analysis employing NAIP5F, NAIP5R, SMNX7DRA and SMNR111 primers is used to amplify the desired genes. The PCR product is digested with an enzyme which recognizes only the centromeric SMN sequence and the digested product can be separated by electrophoresis. The novel method allows multiplex analysis for both NAIP and SMN genes in the same sample work up. The analytical procedure further permits the digestion to be carried out without prior purification of the PCR product. Very importantly, the analytical procedure provides for the ability to diagnose the heterozygous telomeric SMN phenotype and thus allows the non-affected carrier of spinal muscular atrophy to be identified.


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