The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1999
Filed:
Aug. 21, 1996
Gregory E Hindman, Redondo Beach, CA (US);
Dan Slater, La Habra Heights, CA (US);
Thomas Paige, Cypress, CA (US);
Nearfield Systems Incorporated, Carson, CA (US);
Abstract
A two-axis measurement system includes a structural support frame having at least two horizontally disposed parallel rails defining a length of the structural support frame at opposite sides thereof. The support frame further defines a test space between the opposite sides. A bridge extends perpendicularly between the rails and is capable of controlled movement along the rails over the length of the structural support frame. A first probe carriage carried by the bridge permits controlled movement along a span of the bridge. A vertical tower is coupled to the bridge orthogonally with the rails, and a second probe carriage is carried by the vertical tower permitting controlled movement along a height of the vertical tower. The first probe carriage is selectively moveable within a horizontal test plane defined in a first axial dimension by the rails and in a second axial dimension by the bridge by cooperative movement of the bridge and the first probe carriage. The second probe carriage is selectively moveable within a vertical test plane defined in the first axial dimension by the rails and in a third axial dimension by the vertical tower by cooperative movement of the bridge and the second probe carriage.