The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1999
Filed:
Apr. 20, 1995
Katsumi Hayashi, Mishima, JP;
Kazuhiko Saitou, Numazu, JP;
Hiroshi Ohsato, Numazu, JP;
Masaaki Mitani, Numazu, JP;
Tomohiro Hayashi, Mishima, JP;
Takashi Obata, Mishima, JP;
Yutaka Sekine, Numazu, JP;
Mitsuhiro Ura, Suntou-gun, JP;
Takuji Ishii, Numazu, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A derived database processing system in a database processing device comprises a plurality of independent databases which can provide a plurality of users with a group of data to be shared for a common purpose. The derived database processing system comprises a dictionary for managing database logical definition information and database storage information in a secondary memory, a derived database registering unit for determining a definition frame of a new name without violating a definition frame of a name used in a schema definition which defines data in a database, a dictionary information manipulating means for referring to said dictionary when the manipulation target is a derived database, then selecting necessary components of said database, and a database processing procedure generating unit, in a binding process to optimize access routing in a database. The derived database processing means also comprises a database definition management means which replaces an old version of a database definition information with a new version by utilizing a consistency monitoring means and an integrity monitoring means associated with it.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile