The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 1999

Filed:

Jun. 25, 1997
Applicant:
Inventors:

Song C Kim, Santa Clara, CA (US);

James Kaku, Palo Alto, CA (US);

Ken Shin, Castro Valley, CA (US);

Assignee:

Sun Microsystems, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 2231 ;
Abstract

A decode register which receives a first plurality of input lines. If the decode register is not in a scan mode during a given clock cycle, the decode register is configured to convey a decoded output value in response to an input value conveyed on the first plurality of input lines. The decode register also includes a scan decode unit, which receives a second plurality of input lines. When operating in scan mode during a given clock cycle, the decode register is configured to convey a second decoded output value in response to a second input value conveyed on the second plurality of input lines. The second plurality of input lines comprise a scan input line and one or more feedback lines which each correspond to a value on the scan input line during a previous clock cycle. The decode register also includes an encoder which is configured to receive a value indicative of the second decoded output value. In response to receiving the decoded input value, the encoder is configured to convey a corresponding encoded output value on a scan output line and the one or more feedback lines. The encoder implements a serial shift function for the scan input of the decode register. In this manner, a single scan input bit may be used to test each of a plurality of output lines while ensuring only one output line is active at a time. Additionally, with only a single logic stage, the decode register exhibits reduced propagation delay.


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