The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1999
Filed:
Mar. 22, 1996
Norbert Basler, Hoisdorf, DE;
Jorg Fiedler, deceased, late of Ahrensburg, DE;
Bryan Hayes, Hamburg, DE;
Frank Herrmann, Bad Oldesloe, DE;
Basler gmbH, Ahrensburg, DE;
Abstract
The invention relates to a process for the optical testing of a surface of an object, particularly a compact disc, in which the surface is illuminated by at least one light source and the light reflected and/or scattered by the surface is projected onto at least one substantially flat, light-sensitive element of a light-sensitive receiver. The receiver consists of several pixels in the form of a grid in the line direction and the space direction. In a test phase at least one actual image is generated that is compared with at least one desired image which was produced in a read-in phase. To produce an image of the surface with more information the invention provides that during the read-in phase and/or the test phase at least two images of the surface are taken and the image of the surface which is projected on the light-sensitive element is displaced by at least a fraction of the dimension of a pixel in each case in at least one direction with respect to the light-sensitive element. In this way it is possible to detect the ambient field of a pixel so that the printed regions or the like can be classified for an improved evaluation, particularly when producing the desired image.