The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 1999

Filed:

Nov. 07, 1997
Applicant:
Inventors:

Shunske Wakaoka, Konan, JP;

Takao Hasebe, Kasugai, JP;

Assignee:

Okuma Corporation, Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ;
Abstract

A method of automatically measuring sphericity of a ball end mill on a machining device under nearly identical conditions to those at the time of machining. Under a cross rail 1 of the machining device, a laser measuring device (6) is placed through a mount (7) so that a laser optical axis 'a' is in the X-axis direction. A ball end mill T is fixed through a milling chuck (5) to a main spindle (4) carried rotatably by a main spindle ram (3) that can be positioned along the Z-axis direction of a main spindle head 2, which can itself be positioned in the Y-axis direction. While rotating, the tip of ball end mill T is set using laser beams. A position shifted by one radius of a tool from the tip is set as the ball center. One radius of a cutting face is measured by sliding the ball end mill on the nominal of the ball per an arbitrary angle within 90.degree.. The sphericity of the ball end mill T is obtained from the respective one radius at each angle.


Find Patent Forward Citations

Wakaoka, Shunske. (1999). Measuring method of sphericity of ball end mill (U.S. Patent No. 5880847). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5880847

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…