The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 1999

Filed:

Aug. 19, 1997
Applicant:
Inventors:

Erez Hasman, Kiryat Ono, IL;

Asher A Friesem, Rehovot, IL;

Nir Davidson, Rishon LeZion, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 356375 ;
Abstract

A triangulation optical system and method for determining at least one coordinate of a surface of an object, along at least one coordinate axis which is substantially transverse to the surface. The method includes the steps of providing incident light of a substantially wide wavelength bandwidth propagating along the axis. Passing the light through an axially dispersing optics so that the light of different wavelengths is focussed at different locations relative to the axis. The different locations defining a multi-colored measuring area and a distance between extreme locations along the axis defining a depth of measuring range. Further, off-axis imaging of the measuring area, detecting intensity of the image and determining the coordinate of the intersection of the surface with the measuring area.


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