The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1999
Filed:
Aug. 26, 1996
Isao Yamazaki, Tsuchiura, JP;
Hiroshi Ohki, Tsuchiura, JP;
Masaetsu Matsumoto, Chiyoda-machi, JP;
Ryo Miyake, Chiyoda-machi, JP;
Ryohei Yabe, Katsuta, JP;
Hideyuki Horiuchi, Abiko, JP;
Shinichi Sakuraba, Katsuta, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In order to investigate particles in a fluid, a flow cell causes the fluid to flow past a sensor which receives light from a continuous light emission system. When the sensor detects a change in light, a particle detector is triggered, which in turn triggers a pulse generator and hence an intermittent light emission system. Light then illuminates the flow cell to allow a CCD camera to photograph the particle. The photographs taken by the CCD camera are analyzed by an image processor. In order to obtain an accurate particle concentration measurement, it is necessary to modify the initial concentration measurement derived from the analysis of particle images by the image processor by a compensation coefficient. This operation is carried out by a concentration compensator. The result may then be displayed. Additional analysis may be carried out by changing the magnification of the CCD camera, or by selecting for analysis only those particles of a selected size or type.