The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1999
Filed:
Sep. 05, 1997
Haruyoshi Uchiyama, Tokyo, JP;
Zhixien Li, Tokyo, JP;
Yasushi Satoh, Tokyo, JP;
Toshio Kurashima, Mito, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
An object of the present invention is to provide an optical fiber strain measuring apparatus which can perform precise measurement without causing any fluctuation in signal level. To achieve the above object the present invention comprises: a polarization plane rotation device 105 which rotates a plane of polarization of an optical pulse; a photo-directional coupler 106 which projects an optical pulse projected from the polarization plane rotation device 105 into an optical fiber 107 to be measured, and projects out backscattering light produced in the optical fiber 107 to be measured; a polarization plane rotation device 160 which rotates a plane of polarization of a reference light; a light mixing device 109 for mixing the backscattering light projected out from the photo-directional coupler 106 and the reference light projected from the polarization plane rotation device 160; and a signal processing section 111 which detects the mixed light projected from the light mixing device 109, converts the detected light into an electrical signal and subjects the electrical signal to a predetermined operational processing to obtain a measurement waveform.