The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1999
Filed:
Aug. 26, 1996
Kent D Irwin, Boulder, CO (US);
John M Martinis, Boulder, CO (US);
The United States of America as represented by the Secretary of Commerce, Washington, DC (US);
Abstract
This invention provides a method and apparatus for particle detection utilizing an Al/normal-metal bilayer transition-edge sensor (TES) coupled with a particle absorber. The TES is maintained in the transition region where its properties are extremely sensitive to temperature. In the detector, the energy of an absorbed particle is converted to heat by the absorber and the transition from the bilayer's superconducting to normal state is used to sense the temperature rise. The transition temperature, T.sub.c, of the bilayer can be reproducibly controlled as a function of the relative thicknesses and the total thickness of the superconducting and normal-metal layers. The range of available T.sub.c 's extends from below 50 mK to above 1 K, allowing the detector to be tailored to the application. For x-ray detection the preferred T.sub.c is about 50-150 mK. The width of the transition edge can be less than 0.1 mK, which allows very high detector sensitivity.