The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 1999

Filed:

May. 31, 1996
Applicant:
Inventors:

Matthew C Boettner, St. Paul, MN (US);

Steven J Ouderkirk, West Richland, WA (US);

Assignee:

Kovex Corporation, Arden Hills, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; H01J / ;
U.S. Cl.
CPC ...
250234 ; 2502013 ; 359383 ;
Abstract

A confocal microscope is based on a low mass objective that is driven in one or more axis, with at least one of the axes being driven by a low mass device to provide mechanical scanning of the objective. The scanning mechanism has a low resonance so as to allow the scan length, rate, and range to be easily varied. Control of the objective's position can be either open or closed-loop servoed. The position of the objective can be determined in open-loop systems by calibration, by an internal reference signal coupled with a timing system, or via a means for an absolute or relative determination of the objective's position.


Find Patent Forward Citations

Loading…