The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 1999
Filed:
Aug. 06, 1997
Tatsuro Otaki, Tokyo, JP;
Jun Matsuno, Zushi, JP;
Nikon Corporation, Tokyo, JP;
Abstract
This invention relates to a focal position detection apparatus for detecting a positional shift between the imaging position of an object image formed by a predetermined objective optical system and the detection surface of the object image. This apparatus includes a beam splitter for extracting part of a light beam from the objective optical system, splitting the light beam into at least three light beams, and guiding the split light beams to the light-receiving surface of a photo-sensing device arranged at a predetermined position. This beam splitter guides at least the three split light beams to a standard optical path and a pair of reference optical path and forms a standard image at a predetermined position in the standard optical path and a pair of reference images at predetermined positions in the pair of optical paths, respectively. The imaging positions of the pair of reference images are shifted from each other in opposite direction with respect to the imaging surface on which the standard image is formed. The apparatus detects a positional shift by using the optically symmetry of at least one pair of reference images in a focusing state with respect to the standard image.