The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 1999
Filed:
Aug. 26, 1996
Applicant:
Inventors:
Assignee:
NeoPath, Inc., Redmond, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382133 ; 382129 ; 382134 ; 128922 ; 359 39 ;
Abstract
A suite of tests and parameter monitoring methods for at least five major subsystems that are found in most automated image processing systems, as well as calibration routines for three major system functions. The five areas of subsystem verification include processing quality, illumination quality, image collection quality, autofocus quality, and position quality. An automated biological specimen analysis system uses self measures of system parameters to provide a system status. The system status is reported to the user.