logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 5875004 B1

PDFFull Text
Date of Patent:
Feb. 23, 1999

Filed:

Jul. 11, 1997

Image processing inspection apparatus

Applicant:
Inventors:

Toshiki Yamane, Sakai, JP;

Hisato Taniwaki, Nara, JP;

Yoshimasa Fujiwara, Hirakata, JP;

Masayuki Hattori, Shijonawate, JP;

Takayoshi Akiyama, Yokohama, JP;

Assignee:

Matsushita Electric Works, Ltd., Osaka, JP;

Attorney:

Greenblum & Bernstein P.L.C.

Primary Examiner:

Bryan Tung

Assistant Examiner:

Shawn An

Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348705 ; 345508 ;
Abstract

An image processing inspection apparatus comprises a TV camera, a plurality of image-processing-use image memories which are provided for a plurality of screen frames, a plurality of display-use image memories which are provided for a plurality of screen frames, a display monitor, a CPU and a switch for selectively connecting for each screen frame one of the image-processing-use image memories with the TV camera and the CPU, and one of the display-use image memories with the TV camera and the display monitor.

Find Patent Forward Citations

Yamane, Toshiki. (1999). Image processing inspection apparatus (U.S. Patent No. 5875004). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5875004

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…