The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 1999

Filed:

Aug. 29, 1996
Applicant:
Inventors:

Robert Yu, Santa Clara, CA (US);

Paul Yip, Milpitas, CA (US);

Manjunath Doreswamy, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
364489 ; 364488 ; 364490 ; 364491 ;
Abstract

A method of improving the timing performance of a circuit includes the step of producing a first set of timing results from a static timing analyzer operating on a netlist that characterizes a circuit. A critical timing path within the circuit is then identified from the first set of timing results. The critical timing path is then converted into an equivalent schematic circuit representation. A simulation of the equivalent schematic circuit representation on a circuit simulator produces a second set of timing results. Timing discrepancies are then located between the first set of timing results and the second set of timing results. Based upon the timing discrepancies, cells are substituted into the critical timing path to improve the timing performance of the critical timing path.


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