The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1999
Filed:
Oct. 30, 1997
Applicant:
Inventors:
Joel S Douglas, Santa Clara, CA (US);
Karen R Drexler, Los Altos Hills, CA (US);
Jeffrey N Roe, San Ramon, CA (US);
Assignee:
Mercury Diagnostics, Inc., Scotts Valley, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36441309 ; 435-4 ; 435 14 ; 435808 ; 435817 ; 422 56 ; 422 58 ; 422 61 ; 422 67 ; 422 8201 ; 422 8206 ; 204403 ; 204406 ; 204407 ;
Abstract
An analyte detection system is provided with calibration information uniquely specific to the set of test strips to which the sample is to be applied. The calibration information may be stored in permanent memory of the testing device, such that the device is discarded after use of all the test strips in a kit, or it may be stored in a calibration chip accompanying the set of test strips and distributed therewith, thereby enabling re-use of the testing device with a different set of test strips and associated calibration chip.