The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1999
Filed:
May. 07, 1998
Tadashi Kajino, Okazaki, JP;
Masanao Fujieda, Toyohashi, JP;
Yasumi Hikosaka, Gamagori, JP;
Tokio Ueno, Ichinomiya, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
An apparatus for measuring an optical characteristic of an examined lens, comprising a first measuring optical system for projecting a first measuring light flux on an examined lens, which is enlarged so as to cover a relative large area of the lens, via both a first grating and a second grating which has a predetermined positional relationship with the first grating, thereby forming moire fringes thereon, then detecting the moire fringes by a two dimensional photo detector, a first calculating device for calculating each principle point refractive power at each point of the lens by processing results detected by the first measuring optical system, a second measuring optical system for projecting a second measuring light flux on a small area of the lens, then detecting a position of an image of the second measuring light flux by a positional photo-detector, a second calculating device for calculating a back vertex power at the small area by processing results detected by the second measuring optical system, and a display device for obtaining a distribution of each back vertex power at each point of the lens based on both the back vertex power and the each principle point refractive power, then displaying it graphically.