The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 1999

Filed:

Apr. 29, 1997
Applicant:
Inventor:

Yasunori Ueno, Kawasaki, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351211 ; 351205 ;
Abstract

A type of eye refractive power measurement apparatus is capable of measuring the refractive power of left and right eyes through a common measurement optical system and without movement of the entire apparatus. The measurement apparatus includes a measurement system in which a beam of light is projected on the fundus of an eye under examination. The light reflected from the fundus of the eye is received by a light-receiving element. Based on the photoelectric output of the light-receiving element, the refractive power of the eye being examined is measured. A left eye/right eye switching prism selectively guides the light from the measurement system to one of the eyes which is to be subjected to examination. The light is also guided by the switching prism from the selected eye to the measurement system.


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