The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 1999

Filed:

Oct. 23, 1997
Applicant:
Inventors:

Steven M Fischer, Hayward, CA (US);

Curt A Flory, Los Altos, CA (US);

Kent D Henry, Brooklyn, WI (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250281 ; 250282 ; 250294 ; 250296 ; 2503 / ;
Abstract

A mass spectrometer is disclosed which yields fast, full-scan spectra over a wide mass-to-charge ratio range. The instrument contains an ion source which generates nearly monoenergetically-pulsed ion packets which spatially focus at a predetermined distance along the drift path of the ions, a mass filter/analyzer which linearly disperses or deflects the ions in the ion-packets by mass-to-charge ratio by applying a traverse, quadratically time-varying and increasing electric field over the entire length of the deflection region of the mass filter/analyzer, and a spatial mass detector. A method of analyzing the mass-to-charge ratio of ions is also disclosed.


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