The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 1999

Filed:

Aug. 06, 1997
Applicant:
Inventors:

Frederick Van Bebber, deceased, late of Tracy, CA (US);

John F Breznock, Pleasanton, CA (US);

Terry L Calhoun, Oakley, CA (US);

Ronald E Heiskell, Tracy, CA (US);

Ezra A Theys, San Mateo, CA (US);

Assignee:

Clorox Company, Oakland, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33554 ; 335553 ;
Abstract

A container measuring device for measuring minimum and maximum diameters and the ovality of a container finish includes a seat for receiving the container finish and a gauge for measuring the minimum and maximum diameters. The measuring device is balanced on the container with the container finish received in the seat and the measuring device is then rotated to determine the dimensions of the container finish. An adjustable counterweight may be used to balance the measuring device on the container finish. Preferably, the minimum and maximum diameters are recorded by the gauge and transmitted from the gauge to a computer for a determination of whether the container finish dimensions fall within a predetermined tolerance range.


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