The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 1999

Filed:

Apr. 30, 1996
Applicant:
Inventors:

Sandeep K Aggarwal, Santa Cruz, CA (US);

David F Bertucci, San Jose, CA (US);

Marc E Levitt, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 221 ; 324757 ;
Abstract

Circuits and methods of testing an integrated circuit die are disclosed. Active logic setting circuits are incorporated into input cells of a die. During testing, the active logic setting circuits weakly drive the input cells to a definite logic level. Therefore, the necessity of connecting probes to all of the input pads to prevent floating signals in the die is eliminated. Furthermore, during normal operations the active logic setting circuits have little or no effect on the performance of the die.


Find Patent Forward Citations

Aggarwal, Sandeep. (1999). Method and apparatus for on die testing (U.S. Patent No. 5870408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5870408

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…