The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 1999

Filed:

May. 21, 1997
Applicant:
Inventors:

Ralph L Barnett, Wilmette, IL (US);

Theodore Liber, Highland Park, IL (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364578 ; 307115 ; 307116 ; 36420726 ;
Abstract

This invention relates to a novel process with attendant methods and apparatus for testing interlocks on machine barrier guards or equivalent safeguards. The process simulates the breaching of the interlocked safeguard to test the interlock without shutting down the machine operation. Failed interlocks are identified and their status warned against. Furthermore, the associated barrier guards may be physically locked to prevent access to their protected space while allowing normal machine operations until maintenance is practical. The testing process makes possible the reliable interlocking of fixed guards and may be automated to prevent bypassing or sabotage of interlocked safeguarding systems.


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