The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 1999
Filed:
Apr. 09, 1996
Katsumasa Onda, Yokohama, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
In the image pickup phase (A), right and left images are taken in through two image-pickup devices (S101, S102). Then, in the next feature extraction phase (B), right and left images are respectively subjected to feature extraction (S103, S104). Thereafter, in the succeeding matching phase (C), the extracted features of right and left images are compared to check how they match with each other (step S105). More specifically, in the matching phase (C), a one-dimensional window is set, this one-dimensional window is shifted along the left image in accordance with a predetermined scanning rule so as to successively set overlapped one-dimensional windows, and a matching operation is performed by comparing the image features within one window and corresponding image features on the right image. Subsequently, in the disparity determination phase (D), the left image is dissected or divided into plural blocks each having a predetermined size, a histogram in each block is created from disparities obtained by the matching operation based on one-dimensional windows involving pixels of a concerned block, and a specific disparity just corresponding to the peak of thus obtained histogram is identified as a valid disparity representing the concerned block (S106).