The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 1999

Filed:

Sep. 20, 1996
Applicant:
Inventors:

Kenneth R Camplin, Forest, VA (US);

Dennis D Lang, Lynchburg, VA (US);

Darrel P Kohlhorst, Goode, VA (US);

Daniel P Geier, Forest, VA (US);

Gary D Novak, Altavista, VA (US);

Sean M Fitzpatrick, Goode, VA (US);

Glenn E McNeelege, Forest, VA (US);

Bradley E Cox, Lynchburg, VA (US);

Richard C Brewer, Lynchburg, VA (US);

Thomas A Artman, Moneta, VA (US);

Mark A Hooker, Lynchburg, VA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
073643 ; 73159 ; 73597 ; 73598 ; 73602 ;
Abstract

A EMAT inspection system is utiliized on sheet metal prior to it being formed or rolled to identify surface defects and sub-surface defects such as pencil pipe inclusions by using ultrasonic Lamb waves with the results being displayed on a remote screen of a display and control system which also records the inspection results and controls the EMAT system.


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