The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 1999
Filed:
Oct. 25, 1996
Mochida Pharmaceutical Co., Ltd., Tokyo, JP;
Abstract
An analyte and a reactant 3 that reacts with the analyte either directly or indirectly are allowed to react with each other on the analytical areas A of a substrate 1 and signals originating from the reaction are detected. In at least a signal detection step, either a signal generation-related portion 4x or a detector is provided in a portion that is opposed to the substrate 1 and high and low areas are formed in either the substrate 1 or the opposed portion or both in such a manner that the distance from each analytical area A of the substrate to the opposed portion is shorter than the distance from each of the non-analytical areas B of the substrate to the opposed portion, whereby signals originating from the reaction in the analytical areas A will be detected at higher intensities than signals originating from the reaction in the non-analytical areas B. The analyte can be quantitatively or qualitatively analyzed on the analytical areas of the substrate in high precision with reduced effects from the non-analytical areas of the substrate. Simultaneous analysis of multiple samples or simultaneous analysis for multiple items can also be accomplished with a simple sensor configuration.