The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1999
Filed:
Apr. 03, 1997
Tadaharu Kobayashi, Tochigi-ken, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
An x-ray computed tomography device and method for automatically setting scan conditions in order to substantially equalize a designated slice thickness with an effective slice thickness. The device according to the present invention preferably employs a helical scan method. While a rotatable frame portion is continuously rotated in a scanning operation, a detected object can be moved in a body longitudinal direction. A slice thickness designated by an x-ray optical mechanism including a slit and a beam trimming machine and a scan pitch of the helical scan are controlled so that the designated and effective slice thicknesses are substantially equal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile