The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1999
Filed:
Aug. 30, 1996
Applicant:
Inventors:
Roy D Allen, Burlington, MA (US);
Frank Scholten, Livingtson, NJ (US);
Assignee:
Bayer Corporation AGFA Division, Wilmington, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359210 ; 359204 ; 359209 ;
Abstract
A multibeam scanning system for scanning an imaging surface, includes at least one radiation emitter configured to emit a first beam of radiation and a second beam of radiation. A spin deflector, rotatable about a spin axis, is provided to direct the first beam to form a first scan line and the second beam to form a second scan line on the imaging surface. At least one moving element, such as a translating lens, disposed upstream of said spin deflector, operates to deflect at least one of the beams with respect to the spin axis of the spin deflector.