The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 1999

Filed:

May. 23, 1997
Applicant:
Inventors:

Eric N Boe, Long Beach, CA (US);

Gib Lewis, Manhattan Beach, CA (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01Q / ;
U.S. Cl.
CPC ...
342374 ; 342368 ;
Abstract

A quadrant-partitioned array architecture and measurement sequence supporting mutual-coupling based calibration. The architecture includes an array of radiating elements grouped into quadrants, with a quadrant feed network and an intra-quadrant feed network connected between a transmitter/receiver and the radiating elements. The architecture includes test signal switches which provide access for quadrant testing functions, allowing a test signal to be injected into one quadrant while making measurements of the received signal in an adjacent quadrant. Mutual coupling based module-to-module RF measurements are performed to phase up the array.


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