The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1999
Filed:
Jul. 09, 1997
Applicant:
Inventors:
Yasuo Iijima, Toyonaka, JP;
Yoshihiro Matsuda, Ono, JP;
Assignee:
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; G01B / ;
U.S. Cl.
CPC ...
324545 ; 324519 ; 324772 ;
Abstract
A high speed dynamic run-out testing apparatus includes a drive source rotatable at a high speed and having an output shaft, a main shaft coupled coaxially with the output shaft of the drive source, a non-contact bearing for rotatably supporting the main shaft in a non-contact fashion, a testpiece carrier shaft provided on one side of the main shaft remote from the drive source for supporting a cylindrical testpiece mounted on such testpiece carrier shaft, and a non-contact displacement detector for measuring a displacement of the cylindrical testpiece.