The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1999
Filed:
Feb. 13, 1997
John A Reffner, Stamford, CT (US);
Steven H Vogel, Shelton, CT (US);
Spectra-Tech Inc., Shelton, CT (US);
Abstract
A microscope for use in transmissive and reflective infrared spectral analysis of a sample positioned on a sample plane. The microscope uses a collimated beam for infinity correction. A collimated irradiating beam of infrared energy is input to the microscope and focused through a single confocal aperture whereupon the beam is re-collimated and provided to a focusing lens. The focusing lens focuses the beam on a subject sample which generates a resulting image beam. The resulting image beam is re-collimated and provided to an optical element which focuses the resulting image beam back through the single confocal aperture and to an infrared detector. In a preferred embodiment, the size of the single confocal aperture is adjustable and a dichroic element is included for providing simultaneous viewing and infrared measurement of a measured sample. Also in a preferred embodiment, a detector mounting apparatus is included for facilitating orientation of a detector at an infrared output of the microscope.