The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 1999

Filed:

Nov. 27, 1996
Applicant:
Inventor:

Gunter Schoppe, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359385 ; 359368 ; 359638 ;
Abstract

The invention is directed to a confocal scanning microscope for viewing an object. The confocal scanning microscope includes an illuminating device for transmitting an illuminating beam along an illuminating beam path and an optic for defining an imaging beam path. A beamsplitter is mounted in the imaging beam path and has a partially reflecting layer for deflecting a component of the illuminating beam toward the object whereby the component is reflected back toward the beamsplitter and passes through the beamsplitter into the imaging beam path with unwanted reflections occurring within the beamsplitter. The beamsplitter has two prisms conjointly defining the partially reflecting layer and has an external form defined by the optical faces of the prisms with each two mutually adjacent ones of the optical faces conjointly defining an angle unequal to 90.degree. whereby the unwanted reflections are substantially prevented from entering the imaging beam path.


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