The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 1999
Filed:
Dec. 16, 1996
Applicant:
Inventor:
Jeffrey Max Blumenthal, Austin, TX (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
H03F / ; G01R / ;
U.S. Cl.
CPC ...
330-2 ; 3301 / ; 324763 ;
Abstract
A Built-In Self-Test (BIST) circuit and test method are employed for automated testing of a programmable analog gain stage. The BIST circuit and operating method advantageously use the natural redundancy of a multiple-channel circuit for detecting circuit faults. More specifically, the BIST circuit utilizes the natural redundancy of the identical signal paths for multiple-channel, such as stereo, audio operation. A left channel and a right channel ideally function identically so that a fault in one channel of the left channel and the right channel signal paths is detected by mutually comparing the operation of the two channels.