The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1999
Filed:
Aug. 12, 1996
Orgal T Holland, Spotsylvania, VA (US);
Wendy L Poston, Fredericksburg, VA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method of measuring surface roughness is provided in which a video image f a surface area is formed and partitioned into a set of regions that cover the video image. Each region is of equal size. A fractal dimension value is calculated for each region. The fractal dimension values for the regions are averaged to form an average fractal dimension value associated with the particular region size. The steps of partitioning, calculating and averaging are repeated for additional set(s) of regions with each region from an additional set being of an equal and unique size. When all average fractal dimension values are plotted as a function of region size, a best-fit straight line is defined. A combination of the slope and y-intercept of the straight line is indicative of surface roughness of the surface area.