The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1999
Filed:
Mar. 27, 1997
Hideki Kuzuya, Nagoya, JP;
Seiichi Shin, Kitasouma gun, JP;
Aisin Seiki Kabushiki Kaisha, Kariya, JP;
Abstract
The invention is directed to a stability control system for an automatic control system, which includes a controlled system, a measuring unit for measuring a response characteristic of the controlled system, and a computing unit for processing the response characteristic to obtain a standard frequency transfer function and a varied frequency transfer function with a permissive variation to the standard frequency transfer function. A band division unit is provided for dividing the standard frequency transfer function and the varied frequency transfer function into a plurality of bands, respectively. A modeling unit is provided for mathematically approximating the standard frequency transfer function for each band and the varied frequency transfer function for each band, to obtain a standard approximate model and a varied approximate model, respectively. A variation computing unit is provided for computing a variation of the varied approximate model to the standard approximate model for each band. According to the variation in each band, a modern controller, e.g., H.infin. controller is set, thereby to provide a plurality of modern controllers, which are processed by a parallel processing unit in parallel with each other. Then, the controlled system is actuated according to a result processed by the parallel processing unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile