The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1999

Filed:

Dec. 28, 1995
Applicant:
Inventors:

Michael John Donahue, Rochester, NY (US);

Paul John Fleming, Lima, NY (US);

Tracy Fox, Rochester, NY (US);

Edward Michael Kelly, Webster, NY (US);

Michael William Mattern, Hamlin, NY (US);

Carl Michael Petruzelli, Fairport, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J / ; B41J / ;
U.S. Cl.
CPC ...
347237 ; 347240 ;
Abstract

A non-impact printhead having a plurality of driver IC chips and and a plurality of recording elements such as LEDs. Each driver IC chip includes a plurality of current-carrying channels that are operative for carrying current to respective recording elements on the printhead and a control for controlling operation of the driver. The control includes a circuit that provides a test circuit interface which includes (a) a test access port for input of update command signals and clock inputs to the test circuit; (b) a test data input terminal for inputting test data and control data into the chip; (c) a plurality of registers connected to the test data input terminal with at least one of the registers storing control data for controlling operation of the driver; (d) a test data output terminal for outputting test data and control data from the chip to an adjacent chip; and (e) a selector connected to the registers and the test data output terminal for selecting test and control data for output from the test data output terminal.


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