The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1999

Filed:

Nov. 15, 1994
Applicant:
Inventors:

Eiji Saijo, Yokkaichi, JP;

Masahiko Aoyama, Yokkaichi, JP;

Keigo Atsumi, Yokkaichi, JP;

Assignee:

Sumitomo Wiring Systems, Yokkaichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324538 ; 324761 ; 439595 ; 439488 ;
Abstract

To judge with certainty whether the condition of attachment of each metal terminal is proper, a method and apparatus are provided in which a thinned distal end portion of a lance check pin having guide portions contacts an inner surface of a lance flexing space. The lance check pin, when inserted into the lance flexing space, is kept in a proper posture by the guide portions. Therefore, misjudgment of the terminal position is avoided.


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Saijo, Eiji. (1999). Connector examination and correction devices and methods examining and (U.S. Patent No. 5859534). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5859534

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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