The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1999

Filed:

Apr. 29, 1996
Applicant:
Inventors:

Masahiko Ozawa, Yokohama, JP;

Norio Goto, Tokyo, JP;

Masumi Moritani, Yokohama, JP;

Masakatsu Ohkubo, Shimotsuga-gun, JP;

Toshiroo Endoo, Yokohama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C / ; B29C / ;
U.S. Cl.
CPC ...
264401 ; 264 401 ; 264308 ; 36446827 ; 395119 ; 395120 ; 395141 ; 395142 ; 4251744 ;

Find Patent Forward Citations

Ozawa, Masahiko. (1999). Method and apparatus of correcting superfluous curing thickness of (U.S. Patent No. 5858297). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5858297

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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