The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 1999
Filed:
Sep. 12, 1997
Madoka Nishiyama, Yokohana, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An optical disk is formed with grooves and lands for optically tracking an optical signal along a disk substrate. The lands and grooves are tracking guides on the surface of the disk substrate are coated with a recording film. The recording film varies in thickness over different portions of the tracking guides on the surface of the disk. A number of relationships and critical values may be determined by defining film thickness over the top of a land defined by (a), film thickness over a groove by (b), film thickness along a sidewall of a land by (c), groove depth from the top of a land to the bottom of a groove by (d1), and vertical film depth from the top of the film over a land to the top of the film over a groove by (d2). A difference in level (d2) of the recording film is preferably between 100-800 nm and a ratio (b/a) is preferably between 0.6-1.1. Also, a ratio (c/a) is preferably between 0-0.8. The relationships and critical values increase resistance to cross-erasure and allow track pitch to be decreased to enhance high density recording.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile