The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 1999

Filed:

Apr. 05, 1996
Applicant:
Inventors:

Nobuatsu Sasanuma, Yokohama, JP;

Kazuhito Ohashi, Yokohama, JP;

Masahiro Inoue, Yokohama, JP;

Yuichi Ikeda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F / ;
U.S. Cl.
CPC ...
358300 ; 358519 ; 358521 ;
Abstract

This invention has as its object to provide an image processing apparatus and method, which can obtain high image quality by adjusting an image forming parameter or parameters in consideration of a variation in image forming condition. In order to achieve the object, the gradation characteristics of an image to be recorded are adjusted on the basis of information obtained by forming a gradation characteristic adjustment test pattern on a recording medium, and reading the formed test pattern. Subsequently, the color reproduction characteristics of an image to be recorded are adjusted on the basis of information obtained by forming a color reproduction characteristic adjustment test pattern on a recording medium, and reading the formed test pattern.


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