The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 1999

Filed:

Apr. 08, 1997
Applicant:
Inventor:

Lawrence E Curtiss, Concord, MA (US);

Assignee:

Foster-Miller, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ;
U.S. Cl.
CPC ...
356328 ; 356334 ;
Abstract

A spectroanalytical system includes entrance aperture defining structure for receiving radiation to be analyzed along a first path; dispersion structure in the first path for spatially dispersing the radiation as a function of wavelength; exit aperture structure defining a non-elongate aperture for receiving radiation from the dispersion structure; detector aperture structure coupled to the exit aperture structure for detecting selected wavelengths of the dispersion radiation; and wedge-like conditioner structure disposed between the first path and between the dispersion structure and the entrance and exit aperture structures.


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