The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 1999

Filed:

Oct. 30, 1996
Applicant:
Inventors:

Steven C Charlton, Osceola, IN (US);

Larry D Johnson, Mill Creek, IN (US);

Matthew K Musho, Granger, IN (US);

Joseph E Perry, Osceola, IN (US);

Assignee:

Bayer Corporation, Elkhart, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
436 50 ; 436-8 ; 436 14 ; 436 43 ; 436 44 ; 436 46 ; 436 48 ; 436164 ; 436165 ; 364497 ; 36457101 ; 204403 ;
Abstract

A method and apparatus are provided for calibrating a sensor for determination of analyte concentration. The meter includes a sensor for receiving a user sample to be measured and a processor for performing a predefined test sequence for measuring a predefined parameter value. A memory can be coupled to the processor for storing predefined parameter data values. A calibration code is associated with the sensor and read by the processor before the user sample to be measured is received. The calibration code is used in measuring the predefined parameter data value to compensate for different sensor characteristics.


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