The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1998
Filed:
Aug. 02, 1995
Andrei Csipkes, Lawrenceville, GA (US);
John Mark Palmquist, Lilburn, GA (US);
Lucent Technologies Inc., Murry Hill, NJ (US);
Abstract
An offset determination system and method permit accurate calculation of an offset of a central feature of an object. The offset determination system and method are particularly suited for, but not limited to, an automatic inspection system for determining the eccentricity of an optical fiber core relative to a theoretical ideal center of an optical fiber termination. The core is extremely smaller (typically between about 50 and 500 times) in size than the termination boundary. An inspection system has a feature imager, one or more boundary segment imagers but preferably four in number, and a machine vision system connected to the foregoing imagers. The feature imager is positioned to capture an image of the feature (e.g., fiber core endface), and the one or more boundary segment imagers are positioned to capture an image of a corresponding boundary segment of the object (e.g., termination endface). The machine vision system determines the offset, or eccentricity, based upon the feature image, the one or more boundary segment images, and the offset determination system and method.